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Electromigration in ULSI interconnections / Cher Ming Tan

By: Material type: TextTextLanguage: English Publication details: Singapore : World Scientific, 2010Description: 291 p. ; 24 cmISBN:
  • 9789814273329
Subject(s): Theme: Callnumber:
  • 621.381 T1532C
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Asset international series on advances in solid state electronics and technology

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