| 000 | 00735nam a22002657a 4500 | ||
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| 001 | 25117 | ||
| 005 | 20241109222012.0 | ||
| 008 | 210309s2010 eng||||| |||||||||||eng d | ||
| 020 | _a9789814273329 | ||
| 040 |
_aLIB.UNETI _bvie _cLIB.UNETI _eAACR2 |
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| 041 | 0 | _aeng | |
| 044 | _aeng | ||
| 082 |
_a621.381 _bT1532C |
||
| 100 | 1 | _aTan, Ming Cher | |
| 245 | 1 | 0 |
_aElectromigration in ULSI interconnections / _cCher Ming Tan |
| 260 |
_aSingapore : _bWorld Scientific, _c2010 |
||
| 300 |
_a291 p. ; _c24 cm |
||
| 500 | _aAsset international series on advances in solid state electronics and technology | ||
| 653 | _aElectromigration | ||
| 653 | _aInterconnections | ||
| 690 | _a06 | ||
| 691 | _a22 | ||
| 691 | _a68 | ||
| 942 | _cSNV | ||
| 999 |
_c6500 _d6500 |
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