Tan, Ming Cher <br/><br/>
Electromigration in ULSI interconnections / 
Cher Ming Tan 
 - Singapore :  World Scientific,  2010 
 - 291 p. ;  24 cm 
<br/><br/> Asset international series on advances in solid state electronics and technology 
<br/><br/><label>ISBN: </label>9789814273329 
<br/><br/><label>Subjects--Index Terms: </label>Electromigration Interconnections 
<br/><br/><label>Dewey Class. No.: </label>621.381  / T1532C